Depth-resolved magnetization distribution in ultra thin films by soft X-ray resonant magnetic reflectivity

摘要

The analysis of complex magnetic profiles throughout an ul-trathin magnetic films by soft X-ray resonant magnetic reflectivity is discussed. Subnanometer resolution can be achieved allowing the sep-aration of interface and inner layer magnetic contributions as well as the determination of antiferromagnetic and non-collinear spin struc-tures. Reflectivity measurements are carried out up to large scattering angles allowing the determination of the depth-resolved profiles of the out-of-plane magnetic component.