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首页> 外文期刊>The European physical journal, D. Atomic, molecular, and optical physics >Complex scattering potential - Ionization contribution (CSP-ic) method for calculating total ionization cross sections on electron impact
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Complex scattering potential - Ionization contribution (CSP-ic) method for calculating total ionization cross sections on electron impact

机译:复数散射势-电离贡献(CSP-ic)方法,用于计算电子撞击下的总电离截面

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摘要

In this article, we report calculations of total ionization cross sections, Q_(ion), for simple atoms (C, N, O, F) and molecules (NO and NH _3) of atmospheric interest on electron impact at energies from threshold to 2000 eV. We have employed the complex scattering potential - ionization contribution (CSP-ic) method for the present study. Attempt has been made to improve the method by computing the parameter that involves the ratio of sum of the total excitation cross sections (∑Q_(exc)) and total inelastic cross section (Q_(inel)) at the peak of the inelastic cross section. The present study not only provided a better estimation of the parameter involved in the CSP-ic method but also provided better agreement with the available experimental and theoretical data on the ionization cross sections of the simple atomic and molecular targets studied here.
机译:在本文中,我们报告了大气中感兴趣的简单原子(C,N,O,F)和分子(NO和NH _3)对电子在从阈值到2000的能量影响下的总电离截面Q_(ion)的计算。 eV。在本研究中,我们采用了复杂的散射势-电离贡献(CSP-ic)方法。已经尝试通过计算参数来改进该方法,该参数涉及在非弹性横截面的峰值处总激励横截面之和(∑Q_(exc))与总非弹性横截面之和(Q_(inel))之比。 。本研究不仅为CSP-ic方法涉及的参数提供了更好的估计,而且与此处研究的简单原子和分子靶标的电离截面的可用实验和理论数据提供了更好的一致性。

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