The application of wavelet filters in convolution processors for the automatic detection of faults in fringe pattern systems

摘要

The wavelet transform has been proven to be a capable tool for the detection of structures with definite spatial resolution. In this work we extended the filtering procedure to the full complex plane not only in simulation but also in the optical verification by a double frequency plane correlator which is based on three twisted nematic liquid crystal (TN-LC) Spatial Light Modulators (SLM). The paper shows a comparison of the simulation and the optical implementation of the wavelet matched filter approach and discusses the sensitivity of the filter concept.