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On-wafer calibration for pressure sensors

机译:晶圆上压力传感器的校准

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摘要

Portability is expected to continue being a strong driver of new packaging approaches and the area saved on a PWB make new product features possible that can be used for sales promotion. For example altimeters and barometers are incorporated already in clocks and pocket knives [1; 2]. So there is a need of fully linearized pressure sensor systems with small temperature drift and small form factor, i.e. calibrated pressure sensors ideally for flip-chip assembly. Since the handling of chip scale packaged pressure sensors is quite complicated new calibration strategies have to be developed. FhG-IMS Duisburg has set up a method for on-wafer calibration of integrated pressure sensors.
机译:便携性预计将继续成为新包装方法的强大驱动力,并且PWB上节省的面积使新产品功能成为可能,可用于促销。例如,高度计和气压计已被纳入时钟和小刀中[1; 2]。因此,需要具有小温度漂移和小形状因数的完全线性化的压力传感器系统,即理想地用于倒装芯片组装的校准压力传感器。由于芯片尺寸封装的压力传感器的处理非常复杂,因此必须开发新的校准策略。 FhG-IMS杜伊斯堡大学已经建立了一种集成压力传感器在晶圆上校准的方法。

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