Sizes of X-ray radiation coherent domains in thin SmS films and their visualization

摘要

The size of X-ray radiation coherent domains (250 ± 20 ?) is determined in a thin polycrystalline SmS film using X-ray diffraction patterns (θ-2θ scanning, DRON-2 diffractometer, CuK_α radiation) and the Selyakov-Scherrer formula with allowance for the effect of microstrains. An image of this film is taken with a transmission electron microscope, and regions with a characteristic size of 240 ? are clearly visible in it. It is concluded that X-ray radiation coherent domains are visualized.