Determining acceleration from micro- and nanodisplacements measured using autodyne signal of semiconductor laser on quantum-confined structures

摘要

The possibility of using a semiconductor laser for measuring the constant acceleration of an external reflector on micro- and nanodisplacement scales. It is shown that the range of measurable accelerations can be shifted toward smaller values. The minimum measured constant acceleration value was 20 nm/s~2. Using the proposed technique, it is possible to determine constant accelerations in various parts of the trajectory and follow temporal variation of this parameter.