Composition and submicron structure of chemically deposited Cu _2Se-In _2Se _3 films

摘要

Films of substitutional solid solutions of the Cu _2Se-In _2Se _3 system containing up to 7.5 at. % In have been obtained by chemical deposition from aqueous media. The composition, structure, and morphology of the films have been studied. Data of X-ray diffraction and X-ray photoelectron spectroscopy showed that copper in the solid solution occurs in a single-valence state (Cu ~+). The deposited layers possess a globular morphology and are nanostructured.