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Solving protein nanocrystals by cryo-EM diffraction: Multiple scattering artifacts

机译:通过冷冻-EM衍射法解决蛋白质纳米晶体:多个散射伪像

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The maximum thickness permissible within the single-scattering approximation for the determination of the structure of perfectly ordered protein microcrystals by transmission electron diffraction is estimated for tetragonal hen-egg lysozyme protein crystals using several approaches. Multislice simulations are performed for many diffraction conditions and beam energies to determine the validity domain of the required single-scattering approximation and hence the limit on crystal thickness. The effects of erroneous experimental structure factor amplitudes on the charge density map for lysozyme are noted and their threshold limits calculated. The maximum thickness of lysozyme permissible under the single-scattering approximation is also estimated using R-factor analysis. Successful reconstruction of density maps is found to result mainly from the use of the phase information provided by modeling based on the protein data base through molecular replacement (MR), which dominates the effect of poor quality electron diffraction data at thicknesses larger than about 200 A. For perfectly ordered protein nanocrystals, a maximum thickness of about 1000 angstrom is predicted at 200 keV if MR can be used, using R-factor analysis performed over a subset of the simulated diffracted beams. The effects of crystal bending, mosaicity (which has recently been directly imaged by cryo-EM) and secondary scattering are discussed. Structure-independent tests for single-scattering and new microfluidic methods for growing and sorting nanocrystals by size are reviewed. (C) 2014 Elsevier B.V. All rights reserved,
机译:对于四边形的鸡蛋-鸡蛋溶菌酶蛋白质晶体,使用几种方法可以估算出在单散射近似中通过透射电子衍射确定完美有序蛋白质微晶体结构所允许的最大厚度。对许多衍射条件和光束能量进行了多层仿真,以确定所需的单散射近似值的有效域,从而确定了晶体厚度的极限。记录错误的实验结构因子幅度对溶菌酶的电荷密度图的影响,并计算其阈值极限。单散射近似下允许的最大溶菌酶厚度也使用R因子分析进行估算。发现成功重建密度图主要是通过使用基于蛋白质数据库通过分子置换(MR)进行建模提供的相信息来实现的,该相信息在厚度大于200 A的情况下支配了劣质电子衍射数据的影响对于完全有序的蛋白质纳米晶体,如果可以使用MR,则可以通过对一部分模拟衍射束进行R因子分析,预测最大厚度为200 keV时约1000埃。讨论了晶体弯曲,镶嵌性(最近已通过cryo-EM直接成像)和二次散射的影响。审查了与结构无关的单散射测试和新的微流体方法,用于按尺寸生长和分选纳米晶体。 (C)2014 Elsevier B.V.保留所有权利,

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