首页> 外文期刊>Ultramicroscopy >Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design
【24h】

Detecting and locating light atoms from high-resolution STEM images: The quest for a single optimal design

机译:从高分辨率STEM图像中检测和定位轻原子:对单一最佳设计的追求

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

In the present paper, the optimal detector design is investigated for both detecting and locating light atoms from high resolution scanning transmission electron microscopy (HR STEM) images. The principles of detection theory are used to quantify the probability of error for the detection of light atoms from HR STEM images. To determine the optimal experiment design for locating light atoms, use is made of the so-called Cramer-Rao Lower Bound (CRLB). It is investigated if a single optimal design can be found for both the detection and location problem of light atoms. Furthermore, the incoming electron dose is optimised for both research goals and it is shown that picometre range precision is feasible for the estimation of the atom positions when using an appropriate incoming electron dose under the optimal detector settings to detect light atoms. (C) 2016 Elsevier B.V. All rights reserved.
机译:在本文中,研究了用于从高分辨率扫描透射电子显微镜(HR STEM)图像检测和定位光原子的最佳检测器设计。检测理论的原理用于量化从HR STEM图像检测光原子的错误概率。为了确定用于定位轻原子的最佳实验设计,使用了所谓的Cramer-Rao下界(CRLB)。研究是否可以针对轻原子的检测和定位问题找到单一的最佳设计。此外,为两个研究目标优化了入射电子剂量,结果表明,当在最佳检测器设置下使用适当的入射电子剂量检测光原子时,皮米距离精度对于估算原子位置是可行的。 (C)2016 Elsevier B.V.保留所有权利。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号