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Pixelated detectors and improved efficiency for magnetic imaging in STEM differential phase contrast

机译:像素化检测器和提高STEM差分相位对比中的磁成像效率

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摘要

The application of differential phase contrast imaging to the study of polycrystalline magnetic thin films and nanostructures has been hampered by the strong diffraction contrast resulting from the granular structure of the materials. In this paper we demonstrate how a pixelated detector has been used to detect the bright field disk in aberration corrected scanning transmission electron microscopy (STEM) and subsequent processing of the acquired data allows efficient enhancement of the magnetic contrast in the resulting images. Initial results from a charged coupled device (CCD) camera demonstrate the highly efficient nature of this improvement over previous methods. Further hardware development with the use of a direct radiation detector, the Medipix3, also shows the possibilities where the reduction in collection time is more than an order of magnitude compared to the CCD. We show that this allows subpixel measurement of the beam deflection due to the magnetic induction. While the detection and processing is data intensive we have demonstrated highly efficient DPC imaging whereby pixel by pixel interpretation of the induction variation is realised with great potential for nanomagnetic imaging. (C) 2016 The Authors. Published by Elsevier B.V.
机译:由于材料的颗粒结构而产生的强衍射对比度阻碍了差分相衬成像技术在多晶磁性薄膜和纳米结构研究中的应用。在本文中,我们演示了如何在像差校正的扫描透射电子显微镜(STEM)中使用像素化检测器检测亮场磁盘,并且对采集到的数据进行后续处理可以有效增强所得图像中的磁对比度。电荷耦合器件(CCD)相机的初步结果表明,与以前的方法相比,这种改进具有很高的效率。通过使用直接辐射检测器Medipix3进行的进一步硬件开发也显示了与CCD相比,采集时间减少了一个数量级以上的可能性。我们表明,这允许对由于磁感应而引起的束偏转进行亚像素测量。尽管检测和处理是数据密集型的,但我们已经展示了高效的DPC成像,从而实现了对感应变化的逐像素解释,具有很大的纳米磁成像潜力。 (C)2016作者。由Elsevier B.V.发布

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