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The ArrayGrid: A methodology for applying multiple samples to a single TEM specimen grid

机译:ArrayGrid:将多个样本应用于单个TEM样本网格的方法

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High throughput transmission electron microscopy (TEM) is limited by the time that it takes to prepare each specimen and insert it on the microscope. It is further impeded by the deteriorating vacuum of the microscope upon frequent specimen cycling. Nevertheless, in most cases only a small fraction of the specimen is examined and sufficient to provide hundreds of images. Here we demonstrate that microarray technology can be used to accurately position picoliter quantities of different samples in a single TEM grid, with negligible cross-contamination. Key features are a contact-mode deposition on a robust formvar-carbon support. The TEM grid containing a microarray of different samples, the ArrayGrid, can also be negatively stained. The ArrayGrid increases the efficiency of TEM grid preparation and examination by at least by one order of magnitude, and is very suitable for screening and data collection especially in experiments that generate a multiplicity of samples.
机译:高通量透射电子显微镜(TEM)受制于准备每个样本并将其插入显微镜的时间限制。在频繁的样品循环时,显微镜的真空度不断降低,这进一步阻碍了该操作。然而,在大多数情况下,仅检查样本的一小部分,足以提供数百张图像。在这里,我们证明了微阵列技术可用于在单个TEM网格中准确定位微升量的不同样品,且交叉污染可忽略不计。关键功能是在坚固的Formvar-碳载体上的接触模式沉积。包含不同样品的微阵列ArrayGrid的TEM网格也可以进行负染色。 ArrayGrid将TEM网格准备和检查的效率提高了至少一个数量级,非常适用于筛选和数据收集,尤其是在生成大量样品的实验中。

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