Lorentz microscopy mapping for domain wall structure study in L1_0 FePd thin films

摘要

Thin film alloys with perpendicular anisotropy were studied using Lorentz transmission electron microscopy (ITEM). This work focuses on the configuration of domain walls and demonstrates the suitability and accuracy of ITEM for the magnetic characterization of perpendicular magnetic anisotropy materials. Thin films of chemically ordered (L1_0) FePd alloys were investigated by micro-magnetic modeling and LTEM phase retrieval approach. The different components of magnetization described by the modeling were studied on experimental images and confirmed by LTEM contrast simulation. Furthermore, quantitative measurements of magnetic induction inside the domain walls were made by using an original method to separate the electrical and magnetical contributions to the phase information. Irregularities were also observed along the domain walls which could play a major role during the magnetization processes.