Methodology and Experimental System for Measuring and Displaying I-V Characteristic Curves of PV Facilities

摘要

This paper describes a methodology and the developed system for measuring, capturing, and displaying I-V and P-V characteristic curves of photovoltaic (PV) modules or arrays based on single-ended primary inductance converters (SEPIC) in parallel connection, operating in interleaved mode. The proposed methodology and the developed system allow the real time capture and displaying of the I-V and P-V curves of a PV panel or array, and show several advantages with regard to classical methods: simple structure, scalability, fast response, versatility, direct display, and low cost. The measuring of the characteristic curves of PV modules includes high speed of response and high fidelity, with low ripple. An experimental prototype based on four SEPIC converters in parallel connection has been implemented to validate the proposed methodology. This new methodology and experimental system has been registered in the Spanish Patent and Trademark Office with the number P200930198.