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首页> 外文期刊>Progress in photovoltaics >Comparative study of ZnO thin films prepared by plasma deposition and electron beam evaporation for use In photovoltaic devices
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Comparative study of ZnO thin films prepared by plasma deposition and electron beam evaporation for use In photovoltaic devices

机译:等离子体沉积和电子束蒸发制备的ZnO薄膜在光伏器件中的比较研究

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摘要

Undoped zinc oxide thin films were grown at room temperature using two techniques: plasma deposition (PD) and electron beam evaporation in an argon atmosphere. PD offers some advantages, such as low ion damage and low deposition temperature. The optical transmittance of the films deposited by both methods was higher than 80% in the near UV-VIS range; the energy band gap and index of refraction agree with values reported in the literature. The resistivity of films grown by PD was 3.1 × 10~(-2) ?cm, lower than the value of 1.2 × 10~(-1) ? cm found for plasma assisted e-beam evaporated films.
机译:使用两种技术在室温下生长未掺杂的氧化锌薄膜:等离子体沉积(PD)和在氩气中蒸发电子束。 PD具有一些优势,例如低离子损伤和低沉积温度。两种方法沉积的薄膜在近紫外-可见光范围内的透光率均高于80%。能带隙和折射率与文献报道的值一致。通过PD生长的膜的电阻率为3.1×10〜(-2)Ωcm,低于1.2×10〜(-1)Ω·cm的值。用于等离子体辅助电子束蒸发膜的厘米。

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