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首页> 外文期刊>Progress in photovoltaics >Screen-printed emitter-wrap-through solar cell with single step side selective emitter with 18.8% efficiency
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Screen-printed emitter-wrap-through solar cell with single step side selective emitter with 18.8% efficiency

机译:具有效率为18.8%的单步侧选择性发射极的丝网印刷发射极包裹式太阳能电池

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摘要

A fabrication process for Emitter-Wrap-Through solar cells on monocrystalline material with high quality gap passivation by wet thermal silicon dioxide is investigated. Masking and structuring steps are performed by screen-printing technology, Via-holes are created by an industrially applicable high-speed laser drilling process. The cell structure features a selective emitter structure fabricated in a single high temperature step: a highly doped emitter at the via-holes and the rear side, allowing for a low via-hole resistivity as well as a low resistivity contact to screen-printed pastes, and a moderately doped front side emitter exhibiting high quantum efficiency in the low wavelength range. Therefore a novel approach is applied depositing either doped or undoped PECVD silicon dioxide layers on the front side. It is shown that doping profiles advantageous for the EWT-cell structure can be achieved. The screen-printed aluminum paste is found to penetrate the underlying thermal dioxide layer at appropriate contact firing conditions leading to a zone of high recombination in the overlap region of aluminum and silicon dioxide. It is shown that conventional PECVD-anti-refiection silicon nitride acts as effective protection layer reducing the recombination in this region. Designated area conversion efficiencies up to 18.8% on FZ material are obtained applying the single step side selective emitter fabrication technique.
机译:研究了通过湿法热二氧化硅在高品质的间隙钝化的单晶材料上进行发射极-包裹-穿透太阳能电池的制造工艺。掩膜和结构化步骤通过丝网印刷技术执行,通孔通过工业适用的高速激光钻孔工艺制成。单元结构具有在单个高温步骤中制造的选择性发射极结构:通孔和背面的高掺杂发射极,从而实现了低通孔电阻率以及与丝网印刷浆料的低电阻率接触,以及在低波长范围内表现出高量子效率的适度掺杂的正面发射极。因此,采用了一种新颖的方法,在正面沉积了掺杂或未掺杂的PECVD二氧化硅层。示出了可以实现对EWT-电池结构有利的掺杂分布。发现丝网印刷的铝浆在适当的接触烧制条件下穿透下面的热二氧化层,从而在铝和二氧化硅的重叠区域中导致高复合区。已经表明,常规的PECVD抗反射氮化硅用作有效的保护层,减少了该区域中的复合。使用单步侧选择性发射极制造技术可获得FZ材料上高达18.8%的指定面积转换效率。

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