Metallographie Preparation Methods for Atomic Force Microscopy: Atomic Force Microscopy as a Tool for Materialography

摘要

Atomic force microscopy, when combined with nano-indentation, allows both to image the microstructure and sub-microstructure of materials and to locally determine mechanical properties of the structural elements. An appropriate application of the method presupposes that the samples are prepared in a suitable way. "Classical" preparation methods are commonly resorted to for this purpose. The article explicates the specific requirements made to atomic force microscopy with reference to the preparation of two simple nickel base alloys, and discusses the resulting limitations and sources of defects, particularly in performing quantitative metallography. The article shows the way the methods helps in studying the influence of local hardness and elastic stiffness of individual phase zones on the development of a surface topography during sample preparation by mechanical polishing.