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Ion target impact energy during Type I edge localized modes in JET ITER-like Wall

机译:类JET ITER墙中I型边缘局部化模式期间的离子靶撞击能量

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The ITER baseline scenario, with 500 MW of DT fusion power and Q = 10, will rely on a Type I ELMy H-mode, with Delta W = 0.7 MJ mitigated edge localized modes (ELMs). Tungsten (W) is the material now decided for the divertor plasma-facing components from the start of plasma operations. W atoms sputtered from divertor targets during ELMs are expected to be the dominant source under the partially detached divertor conditions required for safe ITER operation. W impurity concentration in the plasma core can dramatically degrade its performance and lead to potentially damaging disruptions. Understanding the physics of plasma-wall interaction during ELMs is important and a primary input for this is the energy of incoming ions during an ELM event. In this paper, coupled Infrared thermography and Langmuir Probe (LP) measurements in JET-ITER-Like-Wall unseeded H-mode experiments with ITER relevant ELM energy drop have been used to estimate the impact energy of deuterium ions (D+) on the divertor target. This analysis gives an ion energy of several keV during ELMs, which makes D+ responsible for most of the W sputtering in unseeded H-mode discharges. These LP measurements were possible because of the low electron temperature (T-e) during ELMs which allowed saturation of the ion current. Although at first sight surprising, the observation of low T-e at the divertor target during ELMs is consistent with the 'Free-Streaming' kinetic model which predicts a near-complete transfer of parallel energy from electrons to ions in order to maintain quasi-neutrality of the ELM filaments while they are transported to the divertor targets.
机译:ITER基线情景的DT融合功率为500 MW,Q = 10,将依赖于I型ELMy H模式,Delta W = 0.7 MJ缓和的边缘局部模式(ELM)。钨(W)是从等离子操作开始就决定用于偏滤器等离子组件的材料。在ELM期间,从偏滤器靶溅射出的W原子预计将是安全ITER操作所需的部分分离的偏滤器条件下的主要来源。等离子体核心中的W杂质浓度会大大降低其性能,并可能导致破坏性破坏。了解ELM期间的等离子体-壁相互作用的物理原理很重要,为此主要输入是ELM事件期间入射离子的能量。在本文中,结合红外热成像和Langmuir探针(LP)在JET-ITER-Like-Wall非种子H模式实验中与ITER相关的ELM能量降进行了测量,以估算氘离子(D +)对分光器的冲击能目标。该分析给出了ELM期间的几个keV离子能量,这使D +负责了非种子H模式放电中的大部分W溅射。这些LP测量是可能的,因为ELM期间的电子温度低(T-e),从而使离子电流饱和。虽然乍看之下令人惊讶,但在ELM期间在偏滤器目标处观察到低Te与“自由流”动力学模型相一致,该模型预测了平行能从电子到离子的几乎完全转移,以保持电子的准中性。 ELM灯丝被运送到偏滤器目标时。

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