Field injection of low-energy electrons into the ZnSe/CdSe/ZnSe heterostructure with the use of an ultra-high-vacuum tunneling microscope

摘要

The field emission injection of low-energy electrons (E _e ≈ 10 eV) into the ZnSe/CdSe/ZnSe heterostructure has been considered. The probe of the ultra-high-vacuum tunneling microscope has been used as a field emitter. It has been shown that the energy of injected electrons is sufficient for impact ionization in ZnSe. The impact ionization creates a high concentration of nonequilibrium carriers in the near-surface ZnSe layer. The transport of nonequilibrium carriers in the heterostructure under study has been simulated. The electric field of the near-surface space charge and surface recombination have been taken into account. The calculation has demonstrated that filling the active region of CdSe with nonequilibrium carriers is highly efficient.