INVESTIGATION OF THE COUPLING BETWEEN THE OUTER ELECTRODES IN THE SUPERCONDUCTING DOUBLE-BARRIER DEVICES

摘要

It is found experimentally that the critical current in the two-terminal double-barrier Nb/Ai-AlOx-Nb/Al-AlOx-Nb device is considerably larger than the critical current in the bottom junction of tile Nb/Al-AlOx-Nb/Al-AlOx-Ta/Nb device of identical planar configuration produced in the same deposition run. Our data suggest that the origin of the phenomena is a direct Josephson coupling between the external electrodes rather than the inductive interaction between the junctions. (C) 1997 Elsevier Science B.V. [References: 15]