...
首页> 外文期刊>Physics Letters, A >Derivation and characterization of dispersion of defect modes in photonic band gap from stacks of positive and negative index materials
【24h】

Derivation and characterization of dispersion of defect modes in photonic band gap from stacks of positive and negative index materials

机译:正负折射率材料叠堆中缺陷模式在光子带隙中色散的导出和表征

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

An expression is derived to predict the incident angle dependence of the frequency of defect modes inside the zero-h gap of one-dimensional photonic crystals stacking with positive and negative index materials. From this expression, the dependence of the dispersion type of the defect mode on both the refractive index and the wave impedance of the component layers of the photonic crystal are given. For situations with a given value of permeability, it is found that, as the adjacent layers of the defect are low refractive index materials, only positive or negative type of angular dispersion exists; as the adjacent layers of the defect are high refractive index materials, all three types of angular dispersion, including the near-zero dispersion, appear with the refractive index of the defect changes. The dispersion relation diagrams of such photonic crystals are presented, the simulated results agree with the theoretical prediction. (c) 2005 Elsevier B.V. All rights reserved.
机译:推导了一个表达式,以预测正负材料堆叠的一维光子晶体在零-h间隙内缺陷模式频率的入射角依赖性。根据该表达式,给出了缺陷模式的色散类型对光子晶体的组成层的折射率和波阻抗的依赖性。对于给定的磁导率值的情况,发现由于缺陷的相邻层是低折射率材料,因此仅存在正或负类型的角度色散;由于缺陷的相邻层是高折射率材料,因此所有三种类型的角色散(包括接近零色散)都会随缺陷折射率的变化而出现。给出了这种光子晶体的色散关系图,仿真结果与理论预测吻合。 (c)2005 Elsevier B.V.保留所有权利。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号