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首页> 外文期刊>IEEE transactions on very large scale integration (VLSI) systems >A 14-bit 200-Ms/s SHA-Less Pipelined ADC With Aperture Error Reduction
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A 14-bit 200-Ms/s SHA-Less Pipelined ADC With Aperture Error Reduction

机译:一个14位200-MS / S的SHA的流水线ADC,减少光圈误差

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This article presents a 14-bit 200-Ms/s pipelined analog-to-digital converter (ADC) for wide input frequency range. The ADC adopts a sample-and-hold amplifier-less (SHA-less) 3.5-bit front-end stage. A dedicated path combining architecture is proposed for the flash sub-ADC-based pipeline ADC to reduce the aperture error, and expand the ADC input frequency up to 490 MHz under 200-Ms/s sampling rate. To further improve the accuracy and reduce power, the sampling capacitor splitting and comparator interpolation techniques are used in the first stage. The proposed ADC has been designed and fabricated in a 180-nm CMOS technology with an area of 2.43 mm(2) including ADC core, the biasing, and the calibration circuit. The measured signal to noise and distortion ratio (SNDR) is 70.6 and 65.6 dB for 30- and 385-MHz inputs, respectively. The SNDR remains 63.1 dB for 490-MHz input. The ADC core consumes 112-mW power under 1.8-V supply. The measured effective resolution bandwidth (ERBW) is about 250 MHz, and the Walden figure of merit (FoM) defined at the ERBW is 116 fJ/conversion-step.
机译:本文介绍了一个14位200-MS / S流水线模数转换器(ADC),用于宽输入频率范围。 ADC采用较少的样品和保持放大器(SHA-DLOSE)3.5位前端阶段。提出了一种专用路径组合架构,用于基于闪光子ADC的流水线ADC,以减小光圈误差,并在200-MS / S采样率下扩展到高达490 MHz的ADC输入频率。为了进一步提高精度和降低功率,在第一阶段使用采样电容分裂和比较器插值技术。所提出的ADC已在180nm CMOS技术中设计和制造,面积为2.43毫米(2)(2),包括ADC芯,偏置和校准电路。对于30-和385-MHz输入,测量的信号与噪声和失真率(SNDR)分别为70.6和65.6dB。 490-MHz输入的SNDR仍然保持63.1dB。 ADC芯消耗112兆瓦的电源下1.8V电源。测量的有效分辨率带宽(ERBW)约为250 MHz,并且在ERBW处定义的沃尔登人物(FOM)是116 FJ /转换步骤。

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