A Test Generation Framework for Quantum Cellular Automata Circuits

摘要

In this paper, we present a test generation framework for quantum cellular automata (QCA) circuits. QCA is a nanotechnology that has attracted recent significant attention and shows promise as a viable future technology. This work is motivated by the fact that the stuck-at fault test set of a circuit is not guaranteed to detect all defects that can occur in its QCA implementation. We show how to generate additional test vectors to supplement the stuck-at fault test set to guarantee that all simulated defects in the QCA gates get detected. Since nanotechnologies will be dominated by interconnects, we also target bridging faults on QCA interconnects. The efficacy of our framework is established through its application to QCA implementations of MCNC and ISCAS'85 benchmarks that use majority gates as primitives