Autotuning of Integrated Inductive Voltage Regulator Using On-Chip Delay Sensor to Tolerate Process and Passive Variations

摘要

This paper demonstrates autotuning of the coefficients of the feedback loop of an inductive integrated voltage regulator (IVR) using an on-chip delay sensor. The proposed approach improves the effective performance of the digital core under variations in the on-die/package integrated passives and transistor process. A 130-nm CMOS test-chip is designed containing a multisampled 125-MHz IVR with a wirebond inductor, on-die capacitor, and all-digital proportional-integral-differential (PID) controller powering a parallel Advanced Encryption Standard (AES) engine. The autotuning is performed using a Vernier delay line based on-chip delay sensor and an all-digital tuning engine. The measurement results demonstrate up to 5.2% improvement in the maximum operating frequency of the AES core using performance-based autotuning.