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Low-pressure Cu-Cu bonding using in-situ surface-modified microscale Cu particles for power device packaging

机译:使用原位表面改性的微型Cu粒子进行低压Cu-Cu键合以用于功率器件包装

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摘要

Since Pb-containing solders are currently being used for die-attach bonding in power device packaging, a number of investigations are targeted towards finding suitable Pb-free high temperature bonding. An oxidation-reduction bonding (ORB) was applied to achieve Cu-Cu bonding with microscale Cu particle paste. During sintering at 300 °C, Cu_2O nanoparticles were homogeneously formed on the surface of the microscale Cu particles through a thermal oxidation, and were subsequently reduced to Cu nanotextured surface in formic acid atmosphere. This in-situ surface modification significantly enhances the sinterability of the microscale Cu particles, leading to a well-sintered microstructure and a three times higher bonding strength than that of the bonding joints prepared with non-oxidation bonding (NOB).
机译:由于含铅焊料目前被用于功率器件封装中的管芯粘接,因此许多研究旨在寻找合适的无铅高温粘接。应用氧化还原键(ORB)以实现与微型Cu颗粒糊剂的Cu-Cu键。在300°C的烧结过程中,通过热氧化将Cu_2O纳米颗粒均匀地形成在微米级Cu颗粒的表面,然后在甲酸气氛中还原为Cu纳米织构的表面。这种原位表面改性显着提高了微米级Cu颗粒的可烧结性,从而导致了烧结良好的微观结构,其粘结强度是用非氧化结合(NOB)制备的结合接头的三倍。

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