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Fabrication of hexagonal GaN on the surface of β-Ga_2O_3 single crystal by nitridation with NH_3

机译:NH_3氮化在β-Ga_2O_3单晶表面制备六方GaN。

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The fabrication of GaN on the surface of a bulk β-Ga_2O_3 single crystal by nitridation with NH_3 was investigated for the purpose of using it as a isubstrate for GaN epitaxial growth. A β-Ga_2O_3 single crystal was prepared using a floating zone furnace with double ellipsoidal mirrors, and its polished (100) plane was nitridated in NH_3 atmosphere at 850℃ for 5 h. It was found that hexagonal GaN with preferred in-plane orientation was produced on the surface of β-Ga_2O_3, and the thickness of nitride layers was approximately 50 nm. High resolution transmission electron microscopic observation indicated that the synthesized GaN was composed of the aggregation with single crystalline GaN particles, whose size iranged from ~5 nm to ~50 nm, and dislocation or defect was not observed in a GaN particle. This method could be expected as a new route to fabricate a substrate for epitaxial growth of III-nitride materials instead of using a bulk GaN single crystal.
机译:为了将其用作GaN外延生长的同质材料,研究了通过用NH_3氮化在块状β-Ga_2O_3单晶表面上制备GaN的方法。用带双椭球面镜的浮区炉制备了β-Ga_2O_3单晶,并将其抛光的(100)面在NH_3气氛中于850℃氮化5小时。发现在β-Ga_2O_3的表面上产生了具有优选的面内取向的六方GaN,并且氮化物层的厚度约为50nm。高分辨率透射电子显微镜观察表明,合成的GaN是由单晶GaN颗粒的聚集体组成,其大小在〜5 nm〜〜50 nm范围内,在GaN颗粒中未观察到位错或缺陷。该方法有望成为制造用于III族氮化物材料外延生长的衬底的新途径,而不是使用块状GaN单晶。

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