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Comparative Analysis Of Photo- And Electroluminescence Of Multilayer Structures With Ge(si)/si(001) Self-assembled Islands

机译:Ge(si)/ si(001)自组装岛的多层结构的光致发光和电致发光比较分析

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This work deals with the investigation of photo-and electroluminescence of multilayer structures with Ge (Si)/Si(001) self-assembled islands, embedded in a p-n junction. The photoluminescence and electroluminescence signals related to the islands have been observed up to room temperature. The decrease of activation energy of the photoluminescence signal temperature quenching with the increase of annealing temperature is associated with the decrease of Ge content in the islands during annealing which results in shallowing the potential well for holes in the islands. A sufficient enhancement of the temperature stability of the electroluminescence signal from the islands was observed with the increase of a pumping current.
机译:这项工作涉及具有Ge(Si)/ Si(001)自组装岛嵌入p-n结的多层结构的光致发光和电致发光的研究。与岛有关的光致发光和电致发光信号已经观察到到室温。随着退火温度的升高,光致发光信号温度猝灭的活化能的降低与岛状物中Ge含量的降低有关,这导致岛状物中空穴的势阱变浅。随着泵浦电流的增加,观察到来自岛的电致发光信号的温度稳定性充分增强。

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