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Excitation-induced Atomic Desorption And Structural Instability Of Iii-v Compound Semiconductor Surfaces

机译:激发诱导的II-v化合物半导体表面原子解吸和结构不稳定性

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摘要

We discuss the laser-induced structural instability of III-V compound semiconductor surfaces. The electronic instability is characterized by local bond rupture of both metallic and nonmetallic atoms at intrinsic surface sites, with the bond-rupture rate super linearly dependent on the excitation density. Spectroscopic studies show that bulk-valence excitation triggers surface bond rupture, and that valence holes are the responsible species. From our results, we propose a mechanistic model based on the two-hole localization induced by a high density of non-equilibrated valence holes, and demonstrate that the model describes all the important features quantitatively and consistently. Additional evidence that further supports the validity of the two-hole mechanism is presented.
机译:我们讨论了激光诱导的III-V族化合物半导体表面的结构不稳定性。电子不稳定性的特征在于金属和非金属原子在本征表面位置处的局部键断裂,键断裂速率超线性地取决于激发密度。光谱研究表明,化合价激发触发表面键断裂,化合价孔是负责任的物种。根据我们的结果,我们提出了一种基于高密度非平衡化合价孔引起的双孔局部化的机械模型,并证明该模型定量且一致地描述了所有重要特征。提出了进一步支持两孔机制有效性的其他证据。

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