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Experimental observation of the strong influence of crystal orientation on Electron Rutherford Backscattering Spectra

机译:晶体取向对电子卢瑟福反向散射光谱影响的实验观察

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摘要

In Electron Rutherford Backscattering Spectroscopy (ERBS) energetic electrons (in our case up to 40keV) impinge on a target and one measures the energy of elastically scattered electrons. This energy depends on the mass of the scattering atom, due to the recoil effect. This technique thus provides information about the sample composition. For single crystals the interaction of the projectile electron with the crystal potential modifies the angular intensity distribution of the scattered electrons. This leads, for example, to the well-known Kikuchi patterns. Here we investigate if such modified angular distribution has any influence on the intensity ratio of the observed elastic peaks in ERBS. Dramatic effects are found. Implications of these observations for quantitative surface analysis using energetic electrons are discussed.
机译:在电子卢瑟福背散射光谱(ERBS)中,高能电子(在我们的情况下为40keV)撞击到目标上,并测量弹性散射电子的能量。由于反冲效应,该能量取决于散射原子的质量。因此,该技术提供了有关样品成分的信息。对于单晶,射弹电子与晶体电势的相互作用改变了散射电子的角强度分布。例如,这导致了众所周知的菊池花纹。在这里,我们研究这种修改后的角度分布是否对ERBS中观察到的弹性峰的强度比有任何影响。发现了戏剧性的效果。讨论了这些观察对于使用高能电子进行定量表面分析的意义。

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