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首页> 外文期刊>Superlattices and microstructures >Investigation of electrical parameters of Au/P3HT:PCBM/ n-6H-SiC/Ag Schottky barrier diode with different current conduction models
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Investigation of electrical parameters of Au/P3HT:PCBM/ n-6H-SiC/Ag Schottky barrier diode with different current conduction models

机译:AU / P3HT电气参数研究:PCBM / N-6H-SIC / AG肖特基势垒二极管,具有不同电流传导模型

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摘要

We have researched the electrical characteristics of Au/P3HT:PCBM-6H-SiC/Ag Schottky barrier diode (SBD) fabricated with a polymer interface layer between 300 and 375 K temperatures. The experimentally obtained parameters from current-voltage (I-V) measurements are calculated with four different current conduction models. It is observed that parameters calculated from research findings related to different methods are compatible with each other. The barrier inhomogeneity of the metal-polymer-semiconductor (MPS) interface layer is explained by Gaussian distribution (GD). Furthermore, the mean barrier height (Φ_(bo)) and the modified effective Richardson constant (A**) are found by drawing Richardson curves of the sample. Finally, the electrical properties of Au/P3HT:PCBM-6H-SiC/Ag SBD have been determined to affect the interface materials and the interface state density (N_(ss)) as well as the current conduction models.
机译:我们研究了AU / P3HT:PCBM / N-6H-SIC / AG肖特基势垒二极管(SBD)的电气特性,其具有300至375k温度之间的聚合物界面层。通过四种不同的电流传导模型计算来自电流 - 电压(I-V)测量的实验获得的参数。观察到从与不同方法相关的研究结果计算的参数彼此兼容。通过高斯分布(GD)解释了金属 - 聚合物半导体(MPS)界面层的阻隔不均匀性。此外,通过绘制样品的Richardson曲线来发现平均屏障高度(φ_(bo))和修改的有效理查森常数(a **)。最后,已经确定了AU / P3HT:PCBM / N-6H-SiC / AG SBD的电性能以影响界面材料和接口状态密度(N_(SS))以及当前的导通模型。

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