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首页> 外文期刊>Superlattices and microstructures >Experimental study and analytical modeling of the channel length influence on the electrical characteristics of small-molecule thin-film transistors
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Experimental study and analytical modeling of the channel length influence on the electrical characteristics of small-molecule thin-film transistors

机译:沟道长度对小分子薄膜晶体管电学特性影响的实验研究与分析建模

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摘要

Bottom-contact p-type small-molecule copper phthalocyanine (CuPc) thin film transistors (TFTs) with different channel lengths have been fabricated by thermal evaporation. The influence of the channel length on the current-voltage characteristics of the fabricated transistors were investigated in the linear and saturation regimes. The devices exhibit excellent p-type operation characteristics. Results show that devices with smaller channel length (L = 2.5 μm and 5 μm) present the best electrical performance, in terms of drain current value, field effect mobility and subthreshold slope. Saturation field-effect mobilities of 1.7 × 10~(-3)cm~2V~(-1) s~(-1) and 1 × 10~(-3)cm~2V~(-1) s~(-1) were obtained for TFTs with channel lengths of L = 2.5 μm and 1 = 5 μm, respectively. Transmission line method was used to study the dependence of the contact resistance with the channel length. Contact resistance becomes dominant with respect to the channel resistance only in the case of short channel devices (i = 2.5 μm and 5 μm). It was also found that the field effect mobility is extremely dependent on the channel length dimension. Finally, an analytical model has been developed to reproduce the dependence of the transfer characteristics with the channel length and the obtained data are in good agreement with the experimental results for all fabricated devices.
机译:通过热蒸发已经制造了具有不同沟道长度的底部接触p型小分子酞菁铜(CuPc)薄膜晶体管。在线性和饱和状态下研究了沟道长度对所制造晶体管的电流-电压特性的影响。该器件具有出色的p型操作特性。结果表明,就漏极电流值,场效应迁移率和亚阈值斜率而言,具有较小沟道长度(L = 2.5μm和5μm)的器件表现出最佳的电气性能。饱和场效应迁移率为1.7×10〜(-3)cm〜2V〜(-1)s〜(-1)和1×10〜(-3)cm〜2V〜(-1)s〜(-1)对于分别具有L =2.5μm和1 =5μm的沟道长度的TFT,获得了1)。用传输线法研究了接触电阻与沟道长度的关系。仅在短沟道器件(i = 2.5μm和5μm)的情况下,接触电阻才是沟道电阻的主导。还发现场效应迁移率极大地取决于沟道长度尺寸。最后,开发了一种分析模型来再现传输特性与沟道长度的相关性,并且所获得的数据与所有制造设备的实验结果都非常吻合。

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  • 来源
    《Superlattices and microstructures》 |2015年第7期|224-236|共13页
  • 作者单位

    Laboratoirede Physique des Materiaux: Structure et Proprietes, Groupe Physique des Composants et Dispositifs Nanometriques, Faculte des Sciencesde Bizerte, 7021 Jarzouna-Bizerte, Universite de Carthage, Tunisia,Department d'Enginyeria Electronica, Universitat Politecnica de Catalunya, C/Jordi Girona, Modul C4, 08034 Barcelona, Spain;

    Laboratoirede Physique des Materiaux: Structure et Proprietes, Groupe Physique des Composants et Dispositifs Nanometriques, Faculte des Sciencesde Bizerte, 7021 Jarzouna-Bizerte, Universite de Carthage, Tunisia;

    Laboratoirede Physique des Materiaux: Structure et Proprietes, Groupe Physique des Composants et Dispositifs Nanometriques, Faculte des Sciencesde Bizerte, 7021 Jarzouna-Bizerte, Universite de Carthage, Tunisia;

    Department d'Enginyeria Electronica, Universitat Politecnica de Catalunya, C/Jordi Girona, Modul C4, 08034 Barcelona, Spain;

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  • 正文语种 eng
  • 中图分类
  • 关键词

    p-type small-molecule; Channel length effect; Contact and channel resistances; Variable range hopping (VRH) model;

    机译:p型小分子;通道长度效应;接触和通道电阻;可变范围跳变(VRH)模型;

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