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Damage detection at cryogenic temperatures in composites using piezoelectric wafer active sensors

机译:使用压电晶片有源传感器检测复合材料在低温下的损伤

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摘要

An experimental evaluation of the structural health monitoring capability of piezoelectric wafer active sensors on composite structures at cryogenic temperatures is presented. The piezoelectric wafer active sensor-based electromechanical impedance and the pitch-catch methods were first qualified for cryogenic temperatures using piezoelectric wafer active sensor—instrumented composite specimens dipped in liquid N_2. Subsequently, damage detection experiments were performed on laboratory-scale composite specimens with (a) impact damage and (b) built-in Teflon patches simulating in service delaminations. Finally, a comprehensive damage detection test was performed on a full-scale specimen subjected to pressure and cryogenic temperature cycles. Based on these tests, we conclude that piezoelectric wafer active sensor-based structural health monitoring methods show promise for damage detection in composite materials even in extreme cryogenic conditions. Recommendations for further work are also included.
机译:提出了在低温下复合结构上压电晶片有源传感器的结构健康监测能力的实验评估。基于压电晶片有源传感器的机电阻抗和螺距捕捉方法首先通过使用压电晶片有源传感器(浸入液体N_2中的仪器化的复合样品)获得了低温温度认证。随后,在实验室规模的复合材料标本上进行了损伤检测实验,其中(a)冲击损伤和(b)模拟使用中分层的内置特氟隆膜片。最后,对经受压力和低温温度循环的满量程样品进行了全面的损伤检测测试。基于这些测试,我们得出结论,即使基于极端低温条件,基于压电晶片有源传感器的结构健康监测方法也有望在复合材料中进行损伤检测。还包括进一步工作的建议。

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