X-ray fluorescence spectrometry: a fast and versatile technique for the analysis of geological samples

摘要

X-ray fluorescence (XRF) spectrometry provides a non-destructive analytical method capable of analysing solids from a few parts per million to near 100% for a wide range of elements (Figure 1). This versatile technique is ideally suited for the analysis of rocks, soils, dust, contaminated land samples, mineral concentrates and products, archaeological artefacts, synthetic materials and metals. The non-destructive nature of the technique allows long term storage of samples, which can then be re-analysed any number of times for additional elements as necessary. This approach therefore, avoids problems of re-sampling and digestion of separate aliquots.