首页> 外文期刊>IEEE Journal of Solid-State Circuits >A 1.0-V VDD CMOS active-pixel sensor with complementary pixel architecture and pulsewidth modulation fabricated with a 0.25-Μm CMOS process
【24h】

A 1.0-V VDD CMOS active-pixel sensor with complementary pixel architecture and pulsewidth modulation fabricated with a 0.25-Μm CMOS process

机译:具有互补像素架构和采用0.25μmCMOS工艺制造的脉宽调制的1.0V VDD CMOS有源像素传感器

获取原文
获取原文并翻译 | 示例
           

摘要

In this paper, an architecture to design a CMOS active-pixel sensor (APS) in an extremely low-voltage environment imposed by advanced CMOS technology is proposed. A complementary active pixel sensor (CAPS) architecture is developed to allow a CMOS active pixel to operate at a voltage below 1 V VDD without using bootstrapping techniques. A fixed voltage deference (FVD) method with correlated double sampling is used to increase the dynamic range of the readout circuit. Both the CAPS and FVD readout circuits together, with an 8-b analog-to-digital converter, are implemented in a commercially available 0.25-Μm, single-poly and five-metal CMOS process. Measurement results show that the circuit is functional at a VDD below 1 V with 15-dB added dynamic range compared with a conventional CMOS APS architecture.
机译:本文提出了一种在先进的CMOS技术强加的极低电压环境下设计CMOS有源像素传感器(APS)的体系结构。开发了互补有源像素传感器(CAPS)架构,以允许CMOS有源像素在低于1 V VDD的电压下运行,而无需使用自举技术。具有相关双采样的固定电压基准(FVD)方法用于增加读出电路的动态范围。 CAPS和FVD读出电路以及一个8-b模数转换器均以市售的0.25μm,单多晶硅和五金属CMOS工艺实现。测量结果表明,与传统的CMOS APS架构相比,该电路可在VDD低于1 V的情况下工作,并增加了15dB的动态范围。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号