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首页> 外文期刊>IEEE Journal of Solid-State Circuits >A 0.5-V 25-MHz 1-mW 256-Kb MTCMOS/SOI SRAM for Solar-Power-Operated Portable Personal Digital Equipment - Sure Write Operation by Using Step-Down Negatively Overdriven Bitline Scheme
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A 0.5-V 25-MHz 1-mW 256-Kb MTCMOS/SOI SRAM for Solar-Power-Operated Portable Personal Digital Equipment - Sure Write Operation by Using Step-Down Negatively Overdriven Bitline Scheme

机译:适用于太阳能供电的便携式个人数字设备的0.5V 25MHz 1-mW 256Kb MTCMOS / SOI SRAM-使用降压负过驱动位线方案确保写入操作

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摘要

Multithreshold-voltage CMOS (MTCMOS) technology has a great advantage in that it provides high-speed operation with low supply voltages of less than 1 V. A logic gate with low-V{sub}(th) MOSFETs has a high operating speed, while a low-leakage power switch with a high-V{sub}(th) MOSFET eliminates the off-leakage current during sleep time. By using MTCMOS circuits and silicon-on-insulator (SOI) devices, the authors have developed a 256-Kb SRAM for solar-power-operated digital equipment. A double-threshold-voltage MOSFET (DTMOS) is adopted for the power switch to further reduce the off leakage. As regards the SRAM core design, we consider a hybrid configuration consisting of high-V{sub}(th) and low-V{sub}(th) MOSFETs (that is, multi-V{sub}(th) CMOS). A new memory cell with a separate read-data path provides a larger readout current without degrading the static noise margin. A negatively overdriven bitline scheme guarantees sure write operation at ultralow supply voltages close to 0.5 V. In addition, a charge-transfer amplifier integrated with a selector and data latches for intrabus circuitry are installed to enhance the operating speed and/or reduce power dissipation. A 32K-word × 8-bit SRAM chip, fabricated with the 0.35-μm multi-V{sub}(th) CMOS/SOI process, has successfully operated at 25 MHz under typical conditions with 0.5-V (SRAM core) and 1-V (I/O buffers) power supplies. The power dissipation during sleep time is less than 0.4 μW and that for 25-MHz operation is 1 mW, excluding that of the I/O buffers.
机译:多阈值CMOS(MTCMOS)技术的一大优势在于,它可以以低于1 V的低电源电压提供高速运行。具有低V {sub}(th)MOSFET的逻辑门具有较高的运行速度,而具有高V {sub}(th)MOSFET的低泄漏功率开关可消除休眠期间的截止泄漏电流。通过使用MTCMOS电路和绝缘体上硅(SOI)器件,作者开发了用于太阳能供电的数字设备的256 Kb SRAM。电源开关采用双阈值电压MOSFET(DTMOS),以进一步减少截止泄漏。关于SRAM内核设计,我们考虑混合配置,其中包括高Vth和低Vth MOSFET(即,多Vth CMOS)。具有独立读取数据路径的新存储单元可提供更大的读出电流,而不会降低静态噪声容限。负过驱动位线方案可确保在接近0.5 V的超低电源电压下确保可靠的写入操作。此外,还安装了集成有选择器和用于内部总线电路的数据锁存器的电荷转移放大器,以提高工作速度和/或降低功耗。采用0.35μm的multi-V {sub}(th)CMOS / SOI工艺制造的32K字×8位SRAM芯片,在0.5V(SRAM内核)和1V的典型条件下,已成功在25MHz下工作-V(I / O缓冲器)电源。睡眠时间期间的功耗小于0.4μW,而25 MHz工作时的功耗为1 mW(不包括I / O缓冲器的功耗)。

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