Physical properties of the CNT:TiO_2 thin films prepared by sol-gel dip coating

摘要

Uniform and highly adherent thin films of CNT:TiO_2 were synthesized by sol-gel dip coating method. Both TiO_2 and CNT:TiO_2 films showed very identical structural characteristics and no significant changes in the lattice values were observed. The crystalline size decreased from 20 nm for TiO2 film to 17 nm for the 4%CNT:TiO_2 film. The film surface was very smooth and compact, as indicated by the roughness data obtained from AFM measurements; the root mean square (rms) average of the roughness was as low as 3 nm. The HRTEM showed that the CNTs are embedded in the matrix of TiO_2 indicating the formation of a composite. In Raman spectra the characteristic vibrations of the TiO_2 are identified, the increase in the FWHM of main anatase peak (144 cm~(-1)) in the case of the 4%CNT:TiO_2 film is interpreted as due to the incorporation of CNTs in the film. At the wavelength of 600 nm the refractive index of pure TiO_2 was 2.07 and the 4%CNT:TiO_2 showed a value of 2.29. The photoresponse curves showed typical features of charge trapping centers in the band gap of the films.