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Effect of the doping of PC_(61)BM electron transport layer with carbon nanodots on the performance of inverted planar MAPbI_3 perovskite solar cells

机译:碳纳米点掺杂PC_(61)BM电子传输层对倒置平面MAPbI_3钙钛矿太阳能电池性能的影响

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The doping effect of carbon nanodots (CNDs) in the PC61BM electron-transport layer on the performance of inverted planar MAPbI(3) perovskite solar cells (PSCs) having two different kinds of the hole-transport layer, namely organic PEDOT:PSS and inorganic NiOx, was investigated. The CH3NH3PbI3 perovskite layer was deposited in air at 35% humidity. An average 11% and 12% enhancement of the power conversion efficiency (PCE) was achieved for 1 wt% CNDs doping in the PSCs with PEDOT:PSS and NiOx respectively. This improvement is attributed to high electron density of CNDs resulting in a triple increase of the electrical conductivity of the PC61BM layer and passivation of the perovskite/PC61BM interface that is reflected by an increase of the open-circuit voltage. In line with this, parallel resistance and fill factor of the PSCs are also improved. Moreover, the energy-resolved electrochemical impedance spectroscopy revealed additional free-charge carriers in the PC61BM layer generated under illumination that were detected via the polaron states formation in the band gap with positive effect on the short-circuit current. All these factors contribute to the PCE improvement. Stability tests of the PSC with PEDOT:PSS under a continuous 24 hour 1.5 AM illumination showed a five times smaller final PCE decrease for the 1 wt% CNDs doping of the PC61BM layer comparing to the undoped counterpart. The passivation effect of CNDs, namely electron filling the traps formed by the photo-dimerization and photo-oxidation of PC61BM molecules, is responsible for this remarkable improvement of the short-term stability.
机译:PC61BM电子传输层中碳纳米点(CND)对具有两种不同类型空穴传输层的倒置平面MAPbI(3)钙钛矿太阳能电池(PSC)性能的掺杂效应研究了NiOx。 CH3NH3PbI3钙钛矿层沉积在空气中,湿度为35%。在分别使用PEDOT:PSS和NiOx的PSC中掺杂1 wt%的CND时,功率转换效率(PCE)分别平均提高了11%和12%。这种改善归因于CND的高电子密度,导致PC61BM层的电导率增加了三倍,并且钙钛矿/ PC61BM界面的钝化被开路电压的增加所反映。与此相应,PSC的并联电阻和填充系数也得到了改善。此外,能量分辨电化学阻抗谱揭示了在光照下在PC61BM层中产生的其他自由电荷载流子,这些载流子是通过带隙中的极化子态形成检测到的,对短路电流有积极影响。所有这些因素都有助于改善PCE。在不间断的24小时1.5 AM照射下,使用PEDOT:PSS的PSC的稳定性测试表明,与未掺杂的PC61BM层相比,掺杂1wt%的CND的最终PCE降低了五倍。 CND的钝化效应,即电子填充了由PC61BM分子的光二聚化和光氧化形成的陷阱,是这种短期稳定性显着提高的原因。

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