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Research on potential induced degradation (PID) of polymeric backsheet in PV modules after salt-mist exposure

机译:盐雾暴露后光伏组件中聚合物背板的潜在诱导降解(PID)研究

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摘要

Recently, solar photovoltaic (PV) systems have been helping to relieve the global energy crisis. However, the service lifetime of PV systems may be shorter than the designed time. The backsheet, which is usually made of polyethylene terephthalate (PET), influences the long-term reliability of PV systems. When a PV system is located in a coastal area, the backsheet usually suffers from various problems such as partial discharge (PD) activity induced by the leakage current caused by potential-induced degradation (PID) because of exposure to salt-mist. Here we used atomic force microscopy (AFM), scanning electron microscopy (SEM), Raman spectroscopy, differential scanning calorimetry (DSC) and phase-resolved partial discharge (PRPD) to explore the PD activity of PET backsheets caused by PID after salt-mist exposure. The analyses revealed that the surface roughness of the PET backsheet increased with the salt-mist duration. Raman spectroscopy indicated that some chemical groups changed after PD activity and salt-mist exposure. The degree of crystallinity increased under the condition of PD activity with increasing salt-mist exposure time. The result of PRPD indicated that PD activity depended salt-mist exposure conditions. From these results, we found that the erosion rate of PET backsheets was influenced by salt-mist exposure and PD activity induced by the leakage current caused by PID. These findings provide guidance to improve the durability of insulating backsheets of PV systems.
机译:最近,太阳能光伏(PV)系统一直在帮助缓解全球能源危机。但是,光伏系统的使用寿命可能短于设计时间。通常由聚对苯二甲酸乙二酯(PET)制成的背板会影响PV系统的长期可靠性。当光伏系统位于沿海地区时,背板通常会遭受各种问题的困扰,例如局部放电(PD)活性,该局部放电是由于暴露于盐雾中而引起的漏电流所引起的,漏电流是由电位诱发的退化(PID)引起的。在这里,我们使用原子力显微镜(AFM),扫描电子显微镜(SEM),拉曼光谱,差示扫描量热法(DSC)和相分辨局部放电(PRPD)来研究盐雾后PID引起的PET背板的PD活性。接触。分析表明,PET背板的表面粗糙度随盐雾持续时间的增加而增加。拉曼光谱表明,PD活性和盐雾暴露后某些化学基团发生了变化。在PD活性条件下,结晶度随盐雾暴露时间的增加而增加。 PRPD的结果表明PD的活性取决于盐雾的暴露条件。从这些结果中,我们发现,PET背板的腐蚀速率受盐雾暴露和PID泄漏电流引起的PD活性的影响。这些发现为提高光伏系统绝缘背板的耐用性提供了指导。

著录项

  • 来源
    《Solar Energy》 |2019年第8期|475-482|共8页
  • 作者单位

    Xian Univ Technol, Dept Elect Engn, 5 South Jinhua Rd, Xian 710048, Shanxi, Peoples R China|Northeast Elect Power Univ, Sch Elect Engn, 169 Changchun Rd, Jilin 132012, Jilin, Peoples R China|Hebei Univ Technol, State Key Lab Reliabil & Intelligence Elect Equip, Tianjin 300130, Peoples R China;

    Northeast Elect Power Univ, Sch Elect Engn, 169 Changchun Rd, Jilin 132012, Jilin, Peoples R China;

    Univ Toulouse, UPS, INPT, LAPLACE Lab Plasma & Convers Energie, 118 Route Narbonne, F-31062 Toulouse 9, France;

    Changzhou Univ, Sch Pertrochem Engn, Changzhou 213164, Peoples R China;

    Shandong Univ Sci & Technol, Sch Mat Sci & Engn, 579 Qianwangang Rd, Qingdao 266590, Shandong, Peoples R China;

    Xian Univ Technol, Dept Elect Engn, 5 South Jinhua Rd, Xian 710048, Shanxi, Peoples R China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Photovoltaics; Potential-induced degradation; Backsheet; Reliability; Crystallinity;

    机译:光伏;潜在的降解;底片;可靠性;结晶度;

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