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Sensitivity Enhancement of Electrolyte–Insulator–Semiconductor Sensors Using Mesotextured and Nanotextured Dielectric Surfaces

机译:使用介孔结构化和纳米化介电表面的电解质-绝缘体-半导体传感器的灵敏度增强

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摘要

We report the fabrication of an electrolyte–insulator–semiconductor (EIS) device with an improved sensitivity brought about by texturization of the functionalized dielectric at the dielectric/electrolyte interface by electrostatic attachment of nanoparticle and mesoparticle. Improvement in sensitivities up to 42% over the nontextured (control) devices was obtained with SiO particles on SiO dielectric. The sensitivity was a function of the size of the particles with higher sensitivities being obtained with smaller particle sizes. The possible contributions of the chemical modification of the dielectric surface by the aminosilanes resulting in the modification of the surface charge, and of the physical modifications by particle texturization leading likely to enhancement of the surface densities of the active binding sites, were highlighted. A novel design for the EIS reservoir for possible improved circuit integration and manufacturability, involving a two-step reservoir in photoresist was demonstrated. This device was capable of characterizing sample volumes as small as L. A and a array was also demonstrated, which could be utilized for multianalyte detection.
机译:我们报告了电解质-绝缘体-半导体(EIS)器件的制造,该器件具有更高的灵敏度,这是通过纳米粒子和中观粒子的静电附着作用在介电质/电解质界面处官能化介电质构化而实现的。使用SiO电介质上的SiO颗粒,与非纹理化(对照)器件相比,灵敏度提高了42%。灵敏度是颗粒尺寸的函数,在较小的粒径下可获得较高的灵敏度。强调了氨基硅烷对介电表面的化学修饰导致表面电荷修饰的可能贡献,以及通过粒子纹理化导致物理修饰的物理修饰可能导致活性结合位点的表面密度增加的可能贡献。展示了一种用于EIS储存器的新颖设计,以改善电路集成和可制造性,其中包括光刻胶中的两步式储存器。该设备能够表征小至L的样品量。还展示了一种可用于多分析物检测的阵列。

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