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Deep Thermal Investigations on Ag2S Thin Film Along With Electropyroelectric and Photothermal Deflection Techniques

机译:Ag2S薄膜的深层热研究以及电热和光热偏转技术

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Nowadays, experiments based on possible obtaining of the thermal proprieties of sulphide semiconductor materials as thin films are in progress. Moreover, to reach by calculation, the thermal constants, such as the thermal conductivity, as well as the thermal diffusivity, of such films remains a principal challenge for many of research teams working in optoelectronic and sensitivity devices. This work covers a new theoretical model of the front-detection electropyroelectric configuration, leading to the determination of the thermal parameters of thin films. A normalisation procedure relative to an empty pyroelectric sensor is used to eliminate instrumental factor. Herein, obtained thermal conductivity and the thermal diffusivity of silver sulphide Ag2S are of the order of 0.90 W.m-1.K-1 and 4.52 10-7m2.s-1, respectively. These values match correctly with the thermal measurements based on well-known photothermal deflection method, which validates our theoretical model.
机译:如今,基于可能获得的硫化物半导体材料的热特性的实验正在进行中。此外,要通过计算得出,此类薄膜的热常数(例如热导率和热扩散率)仍然是许多从事光电和敏感器件研究团队的主要挑战。这项工作涵盖了前检测电热电结构的新理论模型,从而确定了薄膜的热参数。相对于空的热释电传感器的归一化过程用于消除仪器因素。在此,所获得的硫化银Ag 2 S的热导率和热扩散率分别为0.90W.m-1.K-1和4.52 10-7m2.s-1。这些值与基于众所周知的光热偏转方法的热测量值正确匹配,从而验证了我们的理论模型。

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