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Body effect minimization using single layer structure for pH-ISFET applications

机译:在pH-ISFET应用中使用单层结构将身体效应降至最低

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摘要

In this study, the hafnium oxide (HfO_2) thin film deposited by using radio frequency (r.f.) sputter was used as the sensing membrane of ion sensitive field-effect transistor (ISFET) for pH detection. For low cost and easy fabrication, the single HfO_2 gate ISFET without SiO_2 as buffer layer have been developed to compare with the conventional ISFETs with HfO_2 or Si_3N_4 on SiO_2 buffer layer in same process. Electrical characteristics including off current, transconductance, subthreshold swing and body effect of metal-insulator-semiconductor field-effect transistor (MISFF.T) devices and pH sensing properties including sensitivity, linearity, drift coefficient and body effect of ISFET devices were investigated in detail. The single HfO_2 gate MISFET exhibits better electrical performance like higher transconductance, smaller subthreshold swing and lower body effect than the stack HfO_2/SiO_2 gate MISFET and Si_3N_4/SiO_2 gate MISFET. In pH sensing properties, both the single HfO_2 gate ISFET and the stack HfO_2/SiO_2 gate ISFET show better sensing performance than the stack Si_3N_4/SiO_2 gate ISFET. Due to the concern of exact pH detection and high operation speed for commercial product application, the single HfO_2 gate ISFET with lower body effect on pH detection and higher transconductance is a potential candidate to integrate with an analog readout circuit.
机译:在这项研究中,通过射频(r.f.)溅射沉积的氧化ha(HfO_2)薄膜被用作离子敏感场效应晶体管(ISFET)的pH检测膜。为了低成本和容易制造,已经开发了没有SiO_2作为缓冲层的单HfO_2栅极ISFET,以与在相同工艺中在SiO_2缓冲层上具有HfO_2或Si_3N_4的常规ISFET进行比较。详细研究了金属绝缘体-半导体场效应晶体管(MISFF.T)器件的电特性(包括截止电流,跨导,亚阈值摆幅和体效应)以及pH感测特性(包括ISFET器件的灵敏度,线性,漂移系数和体效应) 。与堆叠HfO_2 / SiO_2栅极MISFET和Si_3N_4 / SiO_2栅极MISFET相比,单个HfO_2栅极MISFET具有更好的电性能,例如更高的跨导,较小的亚阈值摆幅和更低的主体效应。在pH感测特性中,单个HfO_2栅极ISFET和堆栈HfO_2 / SiO_2栅极ISFET均比堆栈Si_3N_4 / SiO_2栅极ISFET表现出更好的感测性能。由于关注精确的pH检测和用于商业产品应用的高操作速度,具有较低的本体对pH检测的影响和较高的跨导的HfO_2栅极ISFET是与模拟读出电路集成的潜在候选者。

著录项

  • 来源
    《Sensors and Actuators》 |2010年第2期|494-499|共6页
  • 作者单位

    Department of Electronic Engineering, Chang Gung University, 259 Wen-Hwa 1st Road, Kwei-Shan, Tao-Yuan 333, Taiwan;

    Department of Electronic Engineering, Chang Gung University, 259 Wen-Hwa 1st Road, Kwei-Shan, Tao-Yuan 333, Taiwan;

    Department of Electronic Engineering, Chang Gung University, 259 Wen-Hwa 1st Road, Kwei-Shan, Tao-Yuan 333, Taiwan;

    Department of Electronic Engineering, Chang Gung University, 259 Wen-Hwa 1st Road, Kwei-Shan, Tao-Yuan 333, Taiwan;

    Institute of Biocybernetics and Biomedical Engineering, Polish Academy of Sciences, Trojdena st 4, 02-109 Warsaw, Poland;

    Institute of Electron Technology, Lotnikow av. 32/46, 02-668 Warsaw, Poland;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    MISFET; ISFET; body effect; hafnium oxide; silicon nitride;

    机译:MISFET;ISFET;身体作用氧化氮化硅;

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