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Phonon spectroscopy of carrier heating effects in δ-doped GaAs:Si

机译:δ掺杂GaAs:Si中载流子加热效应的声子光谱

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摘要

At temperatures between 2 and 10 K the phonon induced conductivity of δ-doped GaAs:Si was investigated as a function of carrier heating. Two peculiarities were observed at about 1 and 10 V cm~(-1). The analysis allows us to conclude that they are connected with destruction of weak localization and redistribution of hot carriers between states with different mobilities, respectively.
机译:在2至10 K之间的温度下,研究了由δ掺杂的GaAs:Si的声子感应电导率与载流子加热的关系。在大约1和10 V cm〜(-1)处观察到两个特性。通过分析,我们可以得出结论,它们分别与弱迁移的破坏和热迁移率在具有不同迁移率的状态之间的重新分布有关。

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