首页> 外文期刊>Semiconductor science and technology >Effect of wire width on strain distribution and bandgap in laterally aligned InGaAs/GaAs quantum wire nanostructures
【24h】

Effect of wire width on strain distribution and bandgap in laterally aligned InGaAs/GaAs quantum wire nanostructures

机译:线宽对横向排列的InGaAs / GaAs量子线纳米结构中应变分布和带隙的影响

获取原文
获取原文并翻译 | 示例
       

摘要

The effect of InGaAs quantum wire width in the GaAs matrix on the strain distribution was studied using the finite element method and the resultant strain-modified bandgap was analysed in light of the 'model solid' theory of Van de Walle. The absolute magnitude of the strain in the bulk of the wire was attenuated significantly at the wire end along the width direction. Based on wire centres, the strain-modified direct bandgap increased with the decrease in wire width. The experimentally observed blueshift in photoluminescence spectra reported elsewhere was much higher than the predicted value based on the change in strain-modified bandgap especially at small-width wires. Other sources, such as the association of strain-relieved wire edge to the active region in the small-width wires, were interpreted to contribute significantly to the experimental blueshift.
机译:利用有限元方法研究了GaAs基体中InGaAs量子线宽度对应变分布的影响,并根据范德沃勒的“模型固体”理论分析了所得的应变修饰带隙。导线主体中的应变的绝对大小在导线末端沿宽度方向显着衰减。基于导线中心,应变修改后的直接带隙随导线宽度的减小而增加。根据应变修饰的带隙的变化,尤其是在小宽度导线上,根据实验观察到的在光致发光光谱中观察到的蓝移远高于预测值。其他来源,例如消除应力的导线边缘与小宽度导线中的有效区域的关联,被认为对实验性蓝移有显着贡献。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号