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Dispersive optical constants and temperature-dependent band gap of cadmium-doped indium selenide thin films

机译:掺镉硒化铟薄膜的色散光学常数和随温度变化的带隙

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Polycrystalline cadmium-doped indium selenide thin films were obtained by the thermal co-evaporation of alpha-In2Se3 crystals and Cd onto glass substrates kept at a temperature of 200 degrees C. The temperature dependence of the optical band gap in the temperature region of 300-450 K and the room temperature refractive index, n(lambda), of these films have been investigated. The absorption edge shifts to lower energy as temperature increases. The fundamental absorption edge corresponds to a direct energy gap that exhibits a temperature coefficient of -6.14 x 10(-4) eV K-1. The room temperature n(lambda) which was calculated from the transmittance data allowed the identification of the oscillator strength and energy, static and lattice dielectric constants and static refractive index as 20.06 and 3.07 eV, 7.43 and 10.52 and 2.74, respectively.
机译:通过将α-In2Se3晶体和Cd热共蒸镀到温度保持在200摄氏度的玻璃基板上,可以获得掺杂多晶镉的硒化铟铟薄膜。在300-300摄氏度的温度范围内,光学带隙的温度依赖性已经研究了这些膜的450 K和室温折射率n(λ)。随着温度升高,吸收边移至较低的能量。基本吸收边缘对应于一个直接能隙,该能隙表现出-6.14 x 10(-4)eV K-1的温度系数。根据透射率数据计算得出的室温n(λ)可以确定振荡器强度和能量,静态和晶格介电常数以及静态折射率分别为20.06和3.07 eV,7.43和10.52和2.74。

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