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Effect of In additive on the electrical properties of Se-Te alloy

机译:In添加剂对Se-Te合金电性能的影响

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Electrical measurements are done on Se85-xTe15Inx (x = 0, 2, 4, 6 and 10 at%) thin films. The dark conductivity (sigma(d)) increases and the activation energy (DeltaEd) decreases as the In concentration increases. The photoconductivity (sigma(ph)) also increases with the increase in In concentration. The photosensitivity (sigma(ph)/sigma(d)) decreases sharply after the In incorporation. The charge carrier concentration (n(sigma)) is calculated with the help of dc conductivity measurements. The value of n(sigma) increases as the In concentration increases. The results are explained on the basis of an increase in the density of localized states present in the mobility gap.
机译:在Se85-xTe15Inx(x = 0、2、4、6和10 at%)薄膜上进行电测量。随着In浓度的增加,暗电导率(sigma(d))增大,活化能(DeltaEd)减小。光电导率(sigma(ph))也随着In浓度的增加而增加。 In掺入后,光敏度(σ(ph)/σ(d))急剧下降。借助于直流电导率测量来计算载流子浓度(n(sigma))。随着In浓度的增加,n(sigma)的值增加。基于迁移率间隙中存在的局部状态的密度增加来解释结果。

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