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Temporal evolution of effects of ultrafast carrier dynamics in In_(0.33)Ga_(0.67)N: above and near the bandgap

机译:In_(0.33)Ga_(0.67)N中带隙以上和附近的超快载流子动力学效应的时间演化

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摘要

Ultrafast carrier dynamics in the In_(0.33)Ga_(0.67)N epilayer were investigated in detail, using femtosecond transient differential non-degenerate optical absorption measurements. Following an excitation at 400 nm with fluence ranging from 25 μJ cm~(-2) to 3000 μJ cm~(-2), probing was carried out above and near the bandgap using different wavelengths generated from a super continuum source. We have found that bandgap renormalization plays a key role when probing at photon energies well above the bandgap and it is clearly distinct from other effects at the lowest fluence. The critical carrier density for the onset of noticeable bandgap renormalization effects in this material when probing well above the bandgap is approximately 5 x 10~(18) carriers cm~(-3). We have observed a decrease in the energy loss rate of this material as a function of photogenerated carrier density which is attributed to phonon bottleneck effect. For the lowest carrier density, we have extracted an optical phonon lifetime to be approximately 45 ± 9 fs.
机译:使用飞秒瞬态差分非简并光吸收测量,详细研究了In_(0.33)Ga_(0.67)N外延层中的超快载流子动力学。在400 nm处激发,通量范围从25μJcm-2(-2)到3000μJcm-2(-2),使用超连续谱源产生的不同波长在带隙上方和附近进行探测。我们已经发现,在远高于带隙的光子能量中进行探测时,带隙重归一化起着关键作用,并且在最低通量下,它明显不同于其他效应。当在带隙上方进行探测时,这种材料开始出现明显的带隙重归一化效应的临界载流子密度约为5 x 10〜(18)载流子cm〜(-3)。我们已经观察到,由于声子瓶颈效应,这种材料的能量损失率随着光生载流子密度的变化而降低。对于最低的载流子密度,我们提取了大约45±9 fs的光子寿命。

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