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Fabrication of thin ZnO films with wide-range tuned optical properties by reactive magnetron sputtering

机译:反应磁控溅射制备具有宽范围光学特性的ZnO薄膜

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摘要

We report the manufacturing of thin zinc oxide films by reactive magnetron sputtering at room temperature, and examine their structural and optical properties. We show that the partial oxygen pressure in DC mode can have dramatic effect on absorption and refractive index (RI) of the films in a broad spectral range. In particular, the change of the oxygen pressure from 7% to 5% can lead to either conventional crystalline ZnO films having low absorption and characteristic descending dependence of RI from 2.4-2.7 RIU in the visible to 1.8-2 RIU in the near-infrared (1600 nm) range, or to untypical films, composed of ZnO nano-crystals embedded into amorphous matrix, exhibiting unexpectedly high absorption in the visible-infrared region and ascending dependence of RI with values varying from 1.5 RIU in the visible to 4 RIU in the IR (1600 nm), respectively. Untypical optical characteristics in the second case are explained by defects in ZnO structure arising due to under-oxidation of ZnO crystals. We also show that the observed defect-related film structure remains stable even after annealing of films under relatively high temperatures (30 min under 450 degrees C). We assume that both types of films can be of importance for photovoltaic (as contact or active layers, respectively), as well as for chemical or biological sensing, optoelectronics etc.
机译:我们报告了在室温下通过反应磁控溅射制造氧化锌薄膜的情况,并研究了其结构和光学性质。我们表明,DC模式下的局部氧气压力可以在较宽的光谱范围内对薄膜的吸收和折射率(RI)产生显着影响。尤其是,氧气压力从7%变为5%会导致常规的结晶ZnO薄膜具有较低的吸收率,并且其RI的特征从可见光的RI从2.4-2.7 RIU下降到近红外的1.8-2 RIU (1600 nm)范围或非典型膜,由嵌入非晶态基质中的ZnO纳米晶体组成,在可见红外区表现出出乎意料的高吸收,并且RI的依赖性上升,其变化范围从可见光的1.5 RIU到可见的4 RIU分别为IR(1600 nm)。在第二种情况下,光学特性异常是由ZnO晶体的欠氧化引起的ZnO结构缺陷引起的。我们还表明,即使在较高温度下(450摄氏度下30分钟)进行退火后,观察到的与缺陷相关的薄膜结构仍保持稳定。我们假设两种类型的薄膜对于光伏(分别作为接触层或有源层)以及化学或生物传感,光电等都可能非常重要。

著录项

  • 来源
    《Semiconductor science and technology》 |2018年第2期|025004.1-025004.8|共8页
  • 作者单位

    Royal Inst Technol KTH, Dept Mat Sci & Engn, Brinellvagen 23, SE-10044 Stockholm, Sweden;

    Aix Marseille Univ, CNRS, LP3, Marseille, France;

    CUNY, City Coll New York, Dept Chem Engn, New York, NY 10031 USA;

    Royal Inst Technol KTH, Dept Mat Sci & Engn, Brinellvagen 23, SE-10044 Stockholm, Sweden;

    Aix Marseille Univ, CNRS, LP3, Marseille, France;

    Royal Inst Technol KTH, Dept Mat Sci & Engn, Brinellvagen 23, SE-10044 Stockholm, Sweden;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    reactive magnetron sputtering; thin films; optical properties; zinc oxide;

    机译:反应磁控溅射;薄膜;光学性能;氧化锌;

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