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Room-temperature phototransmittance and photoluminescence characterization of the AlGaAs/InGaAs/GaAs pseudomorphic high electron mobility transistor structures with varied quantum well compositional profiles

机译:具有变化的量子阱组成轮廓的AlGaAs / InGaAs / GaAs拟态高电子迁移率晶体管结构的室温光透射率和光致发光特性

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摘要

We have studied the effects of the two-dimensional electron gas (2DEG) and indium surface segregation in four pseudomorphic AlGaAs/InGaAs/GaAs high electron mobility transistor structures using room-temperature phototransmittance (PT) and photoluminescence (PL) measurements. The PT spectra from the InGaAs modulation-doped quantum well channel can be accounted for by a lineshape function which is the first-derivative of a step-like two-dimensional density of states and a Fend level filling factor. A detailed lineshape fit makes it possible to evaluate the Fend energy, and hence the concentration of 2DEG in addition to the energies of the intersubband transitions. The lowest-lying intersubband transition has been confirmed by a comparison of the PT and PL spectra. From the difference of intersubband transition energies, the surface segregation effects of indium atoms are demonstrated.
机译:我们使用室温光透射率(PT)和光致发光(PL)测量研究了二维电子气(2DEG)和铟表面偏析在四种拟态AlGaAs / InGaAs / GaAs高电子迁移率晶体管结构中的作用。可以通过线形函数解释来自InGaAs调制掺杂的量子阱通道的PT光谱,该函数是阶跃状二维状态密度和Fend能级填充因子的一阶导数。详细的线形拟合使得可以评估Fend能量,因此可以评估2DEG的浓度,以及子带间跃迁的能量。通过比较PT和PL光谱,可以确认最低层的子带间过渡。从子带间跃迁能的差异,证明了铟原子的表面偏析效应。

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