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Industry Divides on Low-K Dielectric Choices

机译:行业对低介电常数选择的分歧

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At the 0.13 μm node, device manufacturers are split among those that will use an organic spin-on dielectric (SOD); those that will use silicate films, produced by PECVD or SOD; and those that will wait until future generations to use these new films, The ability to overcome extensive integration challenges and extend a material's performance will determine a company's long-term success at attaining a tow effective dielectric constant (k_(eff)). Together with copper interconnects, low-k dielectrics deliver faster device speed and reduced crosstalk in advanced devices.
机译:在0.13μm的节点上,器件制造商被划分为使用有机旋涂电介质(SOD)的制造商。那些将使用通过PECVD或SOD生产的硅酸盐膜的膜;以及将要等到子孙后代使用这些新膜的技术,克服广泛的集成挑战并扩展材料性能的能力将决定公司在获得两个有效介电常数(k_(eff))方面的长期成功。低k电介质与铜互连一起提供了更快的设备速度,并减少了高级设备中的串扰。

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