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Ion Implantation Goes Beyond Traditional Parameters

机译:离子注入超越了传统参数

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Ion implant technology has pro-gressed to meet the increasingly demanding requirements posed by continued shrinks. Although alternate technologies such as plasma ion immersion and laser doping are brought out as possible replace- of running out of steam. For years, implant was dominated by hardware design and practically considered a commodity product. Today, it is central to device performance changes. The rubber meets the road at the transistor shrink, and implant is a key part of it. OEMs are focusing on integration, cooperative processes with those involved in activation, and gate formation. Where implant once was an orphan fab process done by different groups, it is now being rapidly integrated into the main line of transistor formation (Fig. 1).
机译:离子注入技术已经取得了进步,以满足不断缩小带来的日益苛刻的要求。尽管提出了替代技术,例如等离子浸入和激光掺杂,以尽可能地消除蒸汽。多年来,植入物一直以硬件设计为主导,实际上被认为是一种商品。今天,它对于设备性能的变化至关重要。橡胶在晶体管收缩时遇到障碍,植入是其中的关键部分。 OEM专注于集成,与激活相关的协作过程以及门形成。植入曾经是由不同小组完成的孤品制造工艺,现在已迅速集成到晶体管形成的主要生产线中(图1)。

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