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Standards for Test

机译:测试标准

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Having joined the bond, assembly, test area from the 300 mm fab, I was quite surprised to discover the minimum amount of standards that serve the test area. The 300 mm ramp-up clearly benefited from extending the existing standards and the creation of a relatively full suite of both software and hardware standards. Both equipment suppliers and fabs benefited from the standards. Equipment suppliers have stated savings of 20-80% because of a reduction in the requirements from IC makers. IC makers saw a 30-50% reduction in the time to bring equipment to production. We believe that similar savings could be seen in the test area.
机译:加入了300毫米晶圆厂的键合,组装和测试区域后,我很惊讶地发现为该测试区域提供服务的最小标准数量。扩展现有标准以及创建相对完整的软件和硬件标准套件,显然可以使300 mm斜升机受益。设备供应商和晶圆厂都受益于该标准。设备供应商表示节省了20-80%,这是因为IC制造商的需求减少了。 IC制造商将设备投入生产的时间减少了30-50%。我们认为,在测试区域可以看到类似的节省。

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